WAN AHMAD, W. F.; SAPUTRA, Y. Strategic Planning Technology Validity Turing Tests Using Artificial Intelligence Understanding. JESII: Journal of Elektronik Sistem InformasI, [S. l.], v. 2, n. 1, p. 142–150, 2024. DOI: 10.31848/jesii.v2i1.3415. Disponível em: https://journal.angga.us/index.php/jesii/article/view/3415. Acesso em: 13 may. 2026.